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Latest News for November 27th, 2015

Physics-based EM models for multi-segment have been published in TCAD

Our recent works have been accepted into IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) as follows: X. Huang, A. Kteyan, S. X.-D. Tan, V. Sukharev, “Physics-based electromigration models and full-chip assessment for power grid networks”, IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (TCAD), (in press) H. Chen, S...